10.1" Venus Panel PC w/ Intel Atom Z8350, PCAP Touch, POE w/ HS Connector (Model: VPCW1010AO2-POE-L)
10.1" Venus, Intel Atom Z8350, 32GB eMMC, 2GB RAM, PCAP, DC12~24V / POE, Ubuntu 19.04, MB w/ HS connector
VPCW1010AO2-POE-L
Component |
CPU |
Intel Atom Z8350 |
CPU Cooler (Type) |
Heatsink |
Memory |
2GB/4GB DDR3L |
Power Supply |
DC Input, 12 ~ 24V/ Powered LAN 802.3AT |
Microphone |
1 x A-MIC |
Speaker |
2 x speaker(L & R) |
Camera |
2.0MP Camera |
Wireless LAN |
WIFI 802.11 b/g/n |
Operating System |
Windows10 IoT 2016 64bit / Android 5.1 |
Storage |
Other Storage Device |
32GB/64GB eMMC |
Panel |
LCD Panel |
10.1", 1280x800 pixel |
Touch Screen |
PCAP |
External I/O |
Serial Port |
1 x RJ45 for RS232 or RS422 or RS485 |
USB Port |
2 x USB 2.0 Type A |
LAN Port |
1 x 10/100/1000 Ethernet |
Wireless LAN Antenna |
1 x PIFA Antenna |
Others |
1 x 4-Pin 3.5mm Audio Jack |
Mechanical |
Power Type |
DC Input, 12 ~ 24V |
Power Connector Type |
DC jack or Powered LAN 802.3AT |
Dimension |
270 x 193 x 28 mm |
Weight |
1.1kg |
Color |
white |
Reliability |
EMI Test |
CE/ FCC class B |
Dust and Rain Test |
Front Panel IP65 |
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|
Vibration Test |
Sine Vibration test (Non-operation)
Reference IEC60068-2-6 Testing procedures
Test Fc : Vibration sinusoidal
1 Test Acceleration : 2G
2 Test frequency : 5~500 Hz
3 Sweep:1 Oct/ per one minute. (logarithmic)
4 Test Axis : X,Y and Z axis
5 Test time :30 min. each axis
6 System condition : Non-Operating mode
Package Vibration Test |
Reference IEC60068-2-64 Testing procedures
Test Fh : Vibration boardband random Test
1. PSD: 0.026G2/Hz , 2.16 Grms
2. Non-operation mode
3. Test Frequency : 5-500Hz
4. Test Axis : X,Y and Z axis
5. 30 min. per each axis
Random Vibration Operation |
Reference IEC60068-2-64 Testing procedures
Test Fh : Vibration boardband random Test
1. PSD: 0.00454G2/Hz , 1.5 Grms
2. Operation mode
3. Test Frequency : 5-500Hz
4. Test Axis : X,Y and Z axis
5. 30 minutes per each axis
6. IEC 60068-2-64 Test:Fh |
Mechanical Shock Test |
Bump Test
Reference IEC 60068-2-29 Testing procedures
Test Eb : Bump Test
1. Wave form:Half Sine wave
2. Acceleration Rate:10g for operation mode
3. Duration Time:11ms
4. No. of Shock:Z axis 300 times
5. Test Axis: Z axis
6. Operation mode |
Drop Test |
1. One corner , three edges, six faces
2. ISTA 2A, IEC-60068-2-32 Test:Ed |
Operating Temperature |
0°C ~ 40°C |
Operating Humidity |
0% ~ 90% Relative Humidity, Non-condensing |
Storage Temperature |
-20°C ~ 60°C |
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